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dc.contributor.authorWATSON, GRAEMEen
dc.date.accessioned2014-01-27T12:31:57Z
dc.date.available2014-01-27T12:31:57Z
dc.date.issued2013en
dc.date.submitted2013en
dc.identifier.citationScanlon, D.O., Regoutz, A., Egdell, R.G., Morgan, D.J., Watson, G.W., Band gap engineering of In2O3 by alloying with Tl2O3, Applied Physics Letters, 103, 26, 2013, art. no. 262108en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/67893
dc.descriptionPUBLISHEDen
dc.description.abstractEfficient modulation of the bandgap of In 2 O 3 will open up a route to improved electronic properties. We demonstrate using ab initio calculations that Tl incorporation into In 2 O 3 reduces the band gap and confirm that narrowing of the gap is observed by X-ray photoemission spectroscopy on ceramic surfaces. Incorporation of Tl does not break the symmetry of the allowed optical transitions, meaning that the doped thin films should retain optical transparency in the visible region, in combination with a lowering of the conduction band effective mass. We propose that Tl-doping may be an efficient way to increase the dopability and carrier mobility of In 2 O 3en
dc.description.sponsorshipEP/F067496; EPSRC; Engineering and Physical Sciences Research Councilen
dc.format.extentart. no. 262108en
dc.language.isoenen
dc.relation.ispartofseriesApplied Physics Lettersen
dc.relation.ispartofseries103en
dc.relation.ispartofseries26en
dc.rightsYen
dc.subjectPhysicsen
dc.titleBand gap engineering of In2O3 by alloying with Tl2O3en
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/watsongen
dc.identifier.rssinternalid91237en
dc.identifier.doihttp://dx.doi.org/10.1063/1.4860986en
dc.rights.ecaccessrightsOpenAccess
dc.contributor.sponsorEngineering and Physical Sciences Research Council (EPSRC)en
dc.contributor.sponsorGrantNumberEP/F067496en


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