Browsing Electronic & Electrical Eng by Author "MOORE, ALAN"
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Characterisation of Macro-porous Silicon for Electronic Applications
PEROVA, TANIA; MOORE, ALAN (SPIE, 2003)Micro-Raman spectroscopy was used in this study for the analysis of the influence of process conditions on the strain and stress in macro-porous layers. As expected, it was found that oxidation results in significant wafer ... -
Effect of ZnS Shell Thickness on the Phonon Spectra in CdSe Quantum Dots
DONEGAN, JOHN FRANCIS; RAKOVICH, YURY; MOORE, ALAN; PEROVA, TANIA (The American Physical Society, 2003)The evolution of the optical phonon spectra of colloidal core/shell CdSe/ZnS quantum dots with an increase of the shell thickness from 0.5 to 3.4 monolayers has been studied by resonant Raman spectroscopy. The results ... -
Electrical Properties of High-k Ta205 Gate Dielectrics on Strained Ge-rich Layers
PEROVA, TANIA; MOORE, ALAN (IEEE, 2004)The electrical properties of ultrathin high-k Zr02 gate dielectric films dcposited on strained Gc-rich layers using microwave plasma enhanced chemical vapor deposition (PECVD) technique at a low temperature (150'C) have ... -
FTIR and Raman Investigation of Vertically Etched Silicon as 1-D Photonic Crystal
MOORE, ALAN; PEROVA, TANIA (SPIE, 2003)The reflection spectra of composite materials on the base of grooved silicon and grooved silicon infiltrated with nematic liquid crystal (LC) have been calculated using the optimal parameters of a grooved silicon matrix ... -
Investigation into the Structure and Composition of Carbon/Carbon-SiC Composites
PEROVA, TANIA; MOORE, ALAN (2003)In this work, pyrolytical carbon and C-SixCy-SiC coatings were deposited by chemical vapour deposition (CVD) in a 'Cold Wall' reactor. The C/C samples from 'Schunk Kohlenstofftechnik GmbH', Germany were used as substrates. ... -
Investigation of correlation between characteristics of Raman spectra and parameters of data-scattering obtained from phase coherence theory
PEROVA, TANIA; MOORE, ALAN (SPIE, 2005)The importance of sensitive monitoring of changes in Raman spectra in particular for microelectronic applications is discussed here. We explore the practicality of using a data-scattering method to analyse Raman spectra, ... -
Local Field Effect on Infrared Phonon Frequencies of Thin Dielectric Films
MOORE, ALAN; PEROVA, TANIA (SPIE, 2003)A number of thin dielectric films deposited onto aluminated glass substrates and onto the materials transparent in the IR range (silicon, KRS-5 and CsI) were investigated using infrared transmission and reflection-absorption ... -
Microtube cavities from templated filtering: confined optical modes and amplified spontaneous emission
MOORE, ALAN; GOUNKO, IOURI; DONEGAN, JOHN FRANCIS; PEROVA, TANIA; RAKOVICH, YURY (American Institute of Physics, 2006)The authors demonstrate a new route to the fabrication of individual aluminosilicate microtubes that can act as micron-scale optical cylindrical resonators. The microtubes were prepared using a simple vacuum assisted ... -
Phase coherence theory for data-mining and analysis: application studies in spectroscopy
PEROVA, TANIA; MOORE, ALAN (SPIE, 2005)The paper investigates from the perspective of computer science the phase coherence theory (PCT) and phase coherent data-scatter (PCD-S). These techniques were originally developed for the area of optical tensiographic ... -
Polarized Raman Spectroscopy of Multilayer Ge/Si(001) Quantum Dot Heterostructures.
PEROVA, TANIA; MOORE, ALAN (American Institute of Physics, 2004)Polarized Raman spectroscopy in backscattering geometry has been applied here for the investigation of Ge/Si(001) quantum dot multilayer structures (with the number of layers ranging from 1 to 21) grown by the Stranski-Krastanov ... -
Rapid Thermal Oxidation of Ge-rich Strained Layers
PEROVA, TANIA; MOORE, ALAN (IEEE, 2004)In this paper, we repolt for thejirsr time the electrical properties ofultrathin oxides grown using rapid thermal oxidation (RTO) on strained Ge-rich layers on relaxed-SiGe buffers. Rapid thermal oxidation on strained ... -
Rapid Thermal Oxidation of Strained-Ge Layers
MOORE, ALAN; PEROVA, TANIA (2004) -
Spectroscopic Investigations of Borosilicate Glass and its Application as a Dopant Source for Shallow Junctions
MOORE, ALAN; PEROVA, TANIA; MC GILP, JOHN FINLAY (Electrochemical Society, 2000)Borosilicate glass was investigated as a dopant source for proximity rapid thermal diffusion. A borosilicate gel was spun onto a silicon wafer and the layer was rapid thermally processed to convert it to a borosilicate ... -
Study of Structure and Quality of Different Silicon Oxides using FTIR and Raman Microscopy
MOORE, ALAN; PEROVA, TANIA (SPIE, 2003)In this work, SiO2 and fluorine and phosphorous doped SiO2 thin films are investigated using FTIR and Raman techniques. FTIR spectroscopy was performed at normal and oblique incidence of the probe beam in transmission ...