"Modelling of Atomic Imaging and Evaporation in the field Ion Microscope"
Item Type:Journal Article
Citation:Keith J. Fraser and John J. Boland, Modelling of Atomic Imaging and Evaporation in the field Ion Microscope , Journal of Sensors, 2012, 2012, 2011, 1 - 8
Modelling of Atomic imaging and Evaporation in the field Ion Microscope.pdf (Published (publisher's copy) - Peer Reviewed) 3.126Mb
Imaging and evaporation of atoms in the field ion microscope (FIM) has been modelled by using finite difference methods to calculate the voltage distribution around a tip and hence the electric field strength experienced by individual atoms. Atoms are evaporated based on field strength using a number of different mathematical models which yield broadly similar results. The tip shapes and simulated FIM images produced show strong agreement with experimental results for tips of the same orientation and crystal structure. Calculations have also been made to estimate the effects on resolution of using a field-sharpened tip for scanning probe microscopy.
Science Foundation Ireland (SFI)
Grant no. 06/IN.1/I106
European Union (EU)
Contract no. 214250
Author: BOLAND, JOHN
Type of material:Journal Article
Series/Report no:Journal of Sensors
Availability:Full text available
Subject (TCD):Nanoscience & Materials