Local chemical composition of nanophase-separated polymer brushes
Citation:
Filimon, M., Kopf, I., Schmidt, D.A., Bründermann, E., Rühe, J., Santer, S., Havenith, M., Local chemical composition of nanophase-separated polymer brushes, Physical Chemistry Chemical Physics, 13, 24, 2011, 11620-11626Download Item:
Abstract:
Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrenepoly(methyl methacrylate) (PSPMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm ? 80 nm
Sponsor
Grant Number
INTCHEM
MEST-CT-2005-02068
European Union (EU)
FP7-NMP-2008-SMALL-
BMBF
05KS7PC2
Author's Homepage:
http://people.tcd.ie/kopfiDescription:
PUBLISHED
Author: KOPF, ILONA
Type of material:
Journal ArticleCollections
Series/Report no:
Physical Chemistry Chemical Physics13
24
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Full text availableSubject (TCD):
Nanoscience & MaterialsDOI:
http://dx.doi.org/10.1039/C0CP02756AMetadata
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