An investigation of novel and next generation semiconductor and piezoelectric materials using Raman spectroscopic characterisation
Citation:
David Adley, 'An investigation of novel and next generation semiconductor and piezoelectric materials using Raman spectroscopic characterisation', [thesis], Trinity College (Dublin, Ireland). Department of Electronic & Electrical Engineering, 2012, pp 205Download Item:
Abstract:
Raman spectroscopy is an increasingly prevalent material characterisation technique and this
work explored its application to several novel semiconductor and piezoelectric materials. Raman
spectroscopy is non-destructive allowing the materials under study to be further characterised
by additional techniques. The preparation of samples is straightforward in comparison
to many existing techniques and allows for in situ measurements. Raman scattering
is a multidisciplinary technique requiring familiarisation with chemistry, condensed matter
physics and material science. Raman spectroscopy was used to examine and characterise
several semiconductor materials that have promising applications in future semiconductor
devices.
Author: Adley, David
Advisor:
Perova, TatianaQualification name:
Doctor of Philosophy (Ph.D.)Publisher:
Trinity College (Dublin, Ireland). Department of Electronic & Electrical EngineeringNote:
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