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dc.contributor.authorSHVETS, IGORen
dc.contributor.authorLUBBEN, OLAFen
dc.contributor.authorCHAIKA, ALEXANDERen
dc.date.accessioned2013-10-21T13:49:36Z
dc.date.available2013-10-21T13:49:36Z
dc.date.issued2011en
dc.date.submitted2011en
dc.identifier.citationChaika, A.N., Nazin, S.S., Semeno, V.N., Glebovskiy, V.G., Bozhko, S.I., Lübben, O., Krasnikov, S.A., (...), Shvets, I.V., Application of single crystalline tungsten for fabrication of high resolution STM probes with controlled structure, Russian Metallurgy (Metally), 2011, 7, 2011, 603-609en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/67516
dc.descriptionPUBLISHEDen
dc.description.abstractThe possibility to fabricate scanning tunneling microscopy (STM) probes with controlled electronic structure using single crystalline tungsten tips is discussed. High resolution power of oriented single crystalline probes is demonstrated in atomic and subatomic resolution STM studies of silicon, gallium telluride and graphite surfaces. The possibility of controllable selection of the tungsten tip atom electron orbitals responsible for the surface imaging in STM experiments is demonstrateden
dc.format.extent603-609en
dc.language.isoenen
dc.relation.ispartofseriesRussian Metallurgy (Metally)en
dc.relation.ispartofseries2011en
dc.relation.ispartofseries7en
dc.rightsYen
dc.subjectTungstenen
dc.subjectScanning tunneling microscopyen
dc.subjectElectron orbitalen
dc.titleApplication of single crystalline tungsten for fabrication of high resolution STM probes with controlled structureen
dc.typeJournal Articleen
dc.contributor.sponsorRussian Foundation for Basic Researchen
dc.contributor.sponsorRussian Foundation for Basic Researchen
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/ivchvetsen
dc.identifier.rssinternalid86911en
dc.identifier.doihttp://dx.doi.org/10.1134/S0036029511070044en
dc.rights.ecaccessrightsOpenAccess
dc.contributor.sponsorGrantNumber080200612en
dc.contributor.sponsorGrantNumber080200006en
dc.subject.TCDThemeNanoscience & Materialsen


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