Application of single crystalline tungsten for fabrication of high resolution STM probes with controlled structure
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2011Access:
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Chaika, A.N., Nazin, S.S., Semeno, V.N., Glebovskiy, V.G., Bozhko, S.I., Lübben, O., Krasnikov, S.A., (...), Shvets, I.V., Application of single crystalline tungsten for fabrication of high resolution STM probes with controlled structure, Russian Metallurgy (Metally), 2011, 7, 2011, 603-609Download Item:
Russian Metallurgy_2011_Chaika_accepted (1).pdf (PDF) 947.3Kb
Abstract:
The possibility to fabricate scanning tunneling microscopy (STM) probes with controlled electronic structure using single crystalline tungsten tips is discussed. High resolution power of oriented single crystalline probes is demonstrated in atomic and subatomic resolution STM studies of silicon, gallium telluride and graphite surfaces. The possibility of controllable selection of the tungsten tip atom electron orbitals responsible for the surface imaging in STM experiments is demonstrated
Sponsor
Grant Number
Russian Foundation for Basic Research
080200612
Russian Foundation for Basic Research
080200006
Science Foundation Ireland (SFI)
Author's Homepage:
http://people.tcd.ie/ivchvetsDescription:
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Russian Metallurgy (Metally)2011
7
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Full text availableKeywords:
Tungsten, Scanning tunneling microscopy, Electron orbitalSubject (TCD):
Nanoscience & MaterialsDOI:
http://dx.doi.org/10.1134/S0036029511070044Licences: