Non-contact high resolution microwave scanning measurement technology
Citation:
Berger, N.; Giraudon, J. C.; Sulzbach, T.; Kantor, R.; Shvets, I. V.; Landstorfer, F. M., Non-contact high resolution microwave scanning measurement technology, Electronics Letters, 39, 14, 2003, 1047 - 1048Download Item:
Abstract:
For non-contact inspection of microwave integrated and hybrid circuits a technical concept and realisation of a high resolution scanning technique for the detection of the electric field distribution has been developed. The near-field signal is measured in magnitude and phase allowing the calculation of the signal flow in the device under test.
Sponsor
Grant Number
European Union (EU)
Author's Homepage:
http://people.tcd.ie/ivchvetsDescription:
PUBLISHED
Author: SHVETS, IGOR
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IEEEType of material:
Journal ArticleCollections
Series/Report no:
Electronics Letters;39;
14;
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Full text availableKeywords:
Particles and fields physics, near-field signalMetadata
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