| dc.contributor.author | SHVETS, IGOR | |
| dc.date.accessioned | 2010-10-14T11:19:23Z | |
| dc.date.available | 2010-10-14T11:19:23Z | |
| dc.date.issued | 2003 | |
| dc.date.submitted | 2003 | en |
| dc.identifier.citation | Berger, N.; Giraudon, J. C.; Sulzbach, T.; Kantor, R.; Shvets, I. V.; Landstorfer, F. M., Non-contact high resolution microwave scanning measurement technology, Electronics Letters, 39, 14, 2003, 1047 - 1048 | en |
| dc.identifier.other | Y | |
| dc.identifier.uri | http://hdl.handle.net/2262/41036 | |
| dc.description | PUBLISHED | en |
| dc.description.abstract | For non-contact inspection of microwave integrated and hybrid circuits a technical concept and realisation of a high resolution scanning technique for the detection of the electric field distribution has been developed. The near-field signal is measured in magnitude and phase allowing the calculation of the signal flow in the device under test. | en |
| dc.description.sponsorship | This work was funded by the European Commission
within the 'p-antenna'-project SMT4-CT97-2189. | en |
| dc.format.extent | 1047 | en |
| dc.format.extent | 1048 | en |
| dc.language.iso | en | en |
| dc.publisher | IEEE | en |
| dc.relation.ispartofseries | Electronics Letters; | |
| dc.relation.ispartofseries | 39; | |
| dc.relation.ispartofseries | 14; | |
| dc.rights | Y | en |
| dc.subject | Particles and fields physics | en |
| dc.subject | near-field signal | en |
| dc.title | Non-contact high resolution microwave scanning measurement technology | en |
| dc.type | Journal Article | en |
| dc.contributor.sponsor | European Union (EU) | en |
| dc.type.supercollection | scholarly_publications | en |
| dc.type.supercollection | refereed_publications | en |
| dc.identifier.peoplefinderurl | http://people.tcd.ie/ivchvets | |
| dc.identifier.rssinternalid | 30557 | |
| dc.identifier.rssuri | http://dx.doi.org/10.1049/el:20030705 | en |
