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dc.contributor.authorDONEGAN, JOHNen
dc.contributor.authorLU, QIAOYINen
dc.contributor.authorGUO, WEI-HUAen
dc.date.accessioned2009-09-22T09:32:52Z
dc.date.available2009-09-22T09:32:52Z
dc.date.issued2008en
dc.date.submitted2008en
dc.identifier.citationGuo, W.H. Byrne, D. Lu, Q.Y. Donegan, J.F., Waveguide Loss Measurement Using the Reflection Spectrum, Photonics Technology Letters, 20, 1685, 2008, 1423-1425en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/33050
dc.descriptionPUBLISHEDen
dc.description.abstractA method for waveguide loss measurement purely based on the reflection spectrum is proposed. Using the Fourier series expansion of the single longitudinal mode in the reflection spectrum, the ratio between the second and first harmonics gives the round-trip loss even when the reflection coefficient of the launching optical field directly reflected by the waveguide facet is unknown. The internal loss of a Fabry?Perot laser diode was measured by the proposed method with results which compare well with those estimated from the amplified spontaneous emission spectrum.en
dc.description.sponsorshipThe authors would like to thank Eblana Photonics for providing the FP laser diode used in the measurement.en
dc.format.extent1423-1425en
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.relation.ispartofseriesPhotonics Technology Lettersen
dc.relation.ispartofseries20en
dc.relation.ispartofseries1685en
dc.rightsYen
dc.subjectAmplified spontaneous emission (ASE), Fourier series expansion, reflection spectrum, waveguide loss.en
dc.titleWaveguide Loss Measurement Using the Reflection Spectrumen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jdoneganen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/guowen
dc.identifier.rssinternalid61055en
dc.identifier.doihttp://dx.doi.org/10.1109/LPT.2008.927885en
dc.identifier.rssurihttp://dx.doi.org/10.1109/LPT.2008.927885
dc.identifier.orcid_id0000-0002-5240-1434en


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