Waveguide Loss Measurement Using the Reflection Spectrum
Citation:Guo, W.H. Byrne, D. Lu, Q.Y. Donegan, J.F., Waveguide Loss Measurement Using the Reflection Spectrum, Photonics Technology Letters, 20, 1685, 2008, 1423-1425
Waveguide Loss.pdf (published (publisher copy) peer-reviewed) 230.2Kb
A method for waveguide loss measurement purely based on the reflection spectrum is proposed. Using the Fourier series expansion of the single longitudinal mode in the reflection spectrum, the ratio between the second and first harmonics gives the round-trip loss even when the reflection coefficient of the launching optical field directly reflected by the waveguide facet is unknown. The internal loss of a Fabry?Perot laser diode was measured by the proposed method with results which compare well with those estimated from the amplified spontaneous emission spectrum.
Type of material:Journal Article
Series/Report no:Photonics Technology Letters
Availability:Full text available
Keywords:Amplified spontaneous emission (ASE), Fourier series expansion, reflection spectrum, waveguide loss.