dc.contributor.author | COEY, JOHN MICHAEL DAVID | |
dc.date.accessioned | 2009-08-20T16:53:54Z | |
dc.date.available | 2009-08-20T16:53:54Z | |
dc.date.issued | 2006 | |
dc.date.submitted | 2006 | en |
dc.identifier.citation | E. Clifford and J. M. D. Coey 'Point contact Andreev reflection by nanoindentation of polymethyl methacrylate' in Applied Physics Letters, 89, (9), 2006, 092506 | en |
dc.identifier.other | Y | en |
dc.identifier.other | Y | |
dc.identifier.uri | http://hdl.handle.net/2262/31889 | |
dc.description | PUBLISHED | en |
dc.description.abstract | A versatile technique for performing spin polarization measurements via point contact Andreev
reflection has been developed. This technique involves depositing a superconductor lead onto a
thin film of the material to be studied through a nanohole formed in a layer of photoresist, using an
atomic force microscope as a nanoindenter. Copper and nickel were used to demonstrate the method.
The polarizations of CrO2 and Co2MnSi were also measured, the former giving a value of 95%, as
expected, and the latter giving 20%, which was surprisingly low for a candidate half metal. | en |
dc.description.sponsorship | This work was supported by Science Foundation Ireland,
as part of the CINSE program. | en |
dc.format.extent | 92506 | en |
dc.format.extent | 188595 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | American Institute of Physics | en |
dc.relation.ispartofseries | Applied Physics Letters | en |
dc.relation.ispartofseries | 89 | en |
dc.relation.ispartofseries | 9 | en |
dc.rights | Y | en |
dc.subject | Physics | en |
dc.title | Point contact Andreev reflection by nanoindentation of polymethyl methacrylate | en |
dc.contributor.sponsor | Science Foundation Ireland | |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/jcoey | |
dc.identifier.rssinternalid | 60515 | |