Point contact Andreev reflection by nanoindentation of polymethyl methacrylate
Citation:
E. Clifford and J. M. D. Coey 'Point contact Andreev reflection by nanoindentation of polymethyl methacrylate' in Applied Physics Letters, 89, (9), 2006, 092506Download Item:
Point contact.pdf (published (publisher copy) peer-reviewed) 184.1Kb
Abstract:
A versatile technique for performing spin polarization measurements via point contact Andreev
reflection has been developed. This technique involves depositing a superconductor lead onto a
thin film of the material to be studied through a nanohole formed in a layer of photoresist, using an
atomic force microscope as a nanoindenter. Copper and nickel were used to demonstrate the method.
The polarizations of CrO2 and Co2MnSi were also measured, the former giving a value of 95%, as
expected, and the latter giving 20%, which was surprisingly low for a candidate half metal.
Sponsor
Grant Number
Science Foundation Ireland
Author's Homepage:
http://people.tcd.ie/jcoeyDescription:
PUBLISHED
Author: COEY, JOHN MICHAEL DAVID
Publisher:
American Institute of PhysicsCollections:
Series/Report no:
Applied Physics Letters89
9
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