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dc.contributor.authorKOKARAM, ANIL CHRISTOPHER
dc.date.accessioned2008-11-17T16:12:30Z
dc.date.available2008-11-17T16:12:30Z
dc.date.created18-20 Sept.en
dc.date.issued2003
dc.date.submitted2003en
dc.identifier.citationV. Bruni, D. Vitulano and A. Kokaram `Line scratches detection and restoration via light diffraction? in Proceedings of the 3rd International Symposium on Image and Signal Processing and Analysis, (ISPA 2003), 18-20 Sept., 1, 2003, pp 5 - 10en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/24564
dc.descriptionPUBLISHEDen
dc.description.abstractSFIen
dc.description.sponsorshipThis paper presents a unified model for the detection and removal of line scratches. It is based on modelling the scratch effect by allowing for the diffraction of light. The paper gives some evidence as to why light diffraction can give rise to scratches. The physical modelling of the defect along with its classification as region of partially missing data allows very good results both in detection and in restoration.en
dc.format.extent5en
dc.format.extent10en
dc.format.extent394029 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherIEEEen
dc.relation.ispartofseriesProceedings of the 3rd International Symposium on Image and Signal Processing and Analysis, (ISPA 2003)en
dc.relation.ispartofseries1en
dc.rightsYen
dc.subjectElectronic & Electrical Engineeringen
dc.titleLine scratches detection and restoration via light diffractionen
dc.typeConference Paperen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/akokaram
dc.identifier.rssinternalid36617
dc.identifier.rssurihttp://ieeexplore.ieee.org/iel5/9084/28837/01296858.pdf?tp=&isnumber=28837&arnumber=1296858&punumber=9084
dc.identifier.rssurihttp://www.sigmedia.tv
dc.contributor.sponsorScience Foundation Ireland


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