Automatic location of IC design errors using an e-beam system

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Conference Paper
Date:
1988
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Citation:
Melgara, M., Battu, M., Garino, P., Dowe, J., Vernay, Y.J., Marzouki, M., Boland, F., Automatic location of IC design errors using an e-beam system, [in] digest of papers - International Test Conference , Washington, DC, : IEEE, 1988, pp898-907
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Abstract:
The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed search
URI:
http://hdl.handle.net/2262/19679
Author's Homepage:
http://people.tcd.ie/fboland
Description:
PUBLISHED
Author: BOLAND, FRANCIS MORGAN
Other Titles:
International Test Conference: 1988
Publisher:
IEEE
Type of material:
Conference Paper
URI:
http://hdl.handle.net/2262/19679
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Full text available
Keywords:
E-beam tester, ADVICE system, VLSI devices
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