Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals
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2007Citation:
V.P. Panov, J.K. Vij, Yu.P. Panarin, C. Blanc, and V. Lorman, Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals, Physical Review E, 75, 4, 2007, 042701 - 042705Download Item:
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Abstract:
The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution
film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic
layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We
show that the major contribution to it arises from a change in the smectic tilt angle.
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Science Foundation Ireland (SFI)
Author's Homepage:
http://people.tcd.ie/jvijhttp://people.tcd.ie/ypanarin
http://people.tcd.ie/vpanov
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Physical Review E75
4
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Electronic & Electrical EngineeringDOI:
http://dx.doi.org/10.1103/PhysRevE.75.042701Licences: