Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity
Citation:Maguire, P.J. and Barry, L.P. and Krug, T. and Dowd, J.O. and Lynch, M. and Bradley, A.L. and Donegan, J.F. and Folliot, H., Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity, Proceedings of SPIE, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks, SPIE Opto-Ireland 2005, John G. McInerney, Gerard Farrell, David M. Denieffe, Liam P. Barry, Harold S. Gamble, Padraig J. Hughes, Alan Moore , 2005, 142 - 143
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The future development of high-speed optical data channels, operating at individual data rates in excess of 100Gbit/s, will require a sensitive and ultra-fast method for pulse measurement . Current high-speed signals are usually characterized using a fast photodetector in conjunction with a high-speed oscilloscope, but are limited to maximum data rate of approximately 40Gbit/s. An alternative is to employ all-optical sampling techniques based on ultra-fast optical nonlinearities present in optical fibres, crystals and semiconductors. One such nonlinearity is the optical-to-electrical process of Two-Photon Absorption (TPA) in a semiconductor .
Other Titles:Proceedings of SPIE, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks
SPIE Opto-Ireland 2005
Type of material:Conference Paper
Availability:Full text available