Application of matrix methods for investigation of silicon based layered structures
Citation:
Sergey Dyakov, 'Application of matrix methods for investigation of silicon based layered structures', [thesis], Trinity College (Dublin, Ireland). Department of Electronic & Electrical Engineering, 2012, pp 200Download Item:
Abstract:
This work is dedicated to the theoretical and experimental investigation
of the influence of nano- and microstructuring of silicon systems
on their linear optical response. The wavelengths of the light are
comparable to the typical size of the investigated structures. For calculation
of passive and active optical characteristics in the considered
spectral range, the transfer and the scattering matrix methods are
used.
Author: Dyakov, Sergey
Advisor:
Perova, TatianaQualification name:
Doctor of Philosophy (Ph.D.)Publisher:
Trinity College (Dublin, Ireland). Department of Electronic & Electrical EngineeringNote:
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