Optical impedance matching studied with Scanning Near-Field Optical Microscopy
Citation:
Anselm Gademann, 'Optical impedance matching studied with Scanning Near-Field Optical Microscopy', [thesis], Trinity College (Dublin, Ireland). School of Physics, 2003, pp 147Download Item:
Gademann TCD THESIS 7293 Optical impedance.pdf (PDF) 65.56Mb
Abstract:
This thesis is a study of reflection-mode Scanning Near-Field Optical Microscopy (SNOM). A microscope was built for non-invasive imaging of samples, with optical resolutions better than the diffraction limit. The microscope also incorporates a mechanism for imaging the topography of a sample with a resolution better than 30 nm. The newly implemented shear-force system is based on a tuning fork method and therefore does not rely on an additional laser close to the tip apex. The design of the SNOM and of a fibre pulling machine for producing optical fibre tips will be presented, along with results obtained on test, calibration and transmission line samples.
Author: Gademann, Anselm
Advisor:
Shvets, IgorQualification name:
Doctor of Philosophy (Ph.D.)Publisher:
Trinity College (Dublin, Ireland). School of PhysicsNote:
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Full text availableKeywords:
Physics, Ph.D., Ph.D. Trinity College DublinLicences: