Imaging and identification of point defects in PtTe2

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2021Access:
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Kuanysh Zhussupbekov, Lida Ansari, John B. McManus, Ainur Zhussupbekova, Igor V. Shvets, Georg S. Duesberg, Paul K. Hurley, Farzan Gity, Cormac Ó Coileáin & Niall McEvoy, Imaging and identification of point defects in PtTe2, npj 2D Materials and Applications, 5, 14, 2021Download Item:

Abstract:
The properties and performance of two-dimensional (2D) materials can be greatly affected by point defects. PtTe2, a 2D material
that belongs to the group 10 transition metal dichalcogenides, is a type-II Dirac semimetal, which has gained a lot of attention
recently due to its potential for applications in catalysis, photonics, and spintronics. Here, we provide an experimental and
theoretical investigation of point defects on and near the surface of PtTe2. Using scanning tunneling microscopy and scanning
tunneling spectroscopy (STS) measurements, in combination with first-principle calculations, we identify and characterize five
common surface and subsurface point defects. The influence of these defects on the electronic structure of PtTe2 is explored in
detail through grid STS measurements and complementary density functional theory calculations. We believe these findings will be
of significance to future efforts to engineer point defects in PtTe2, which is an interesting and enticing approach to tune the chargecarrier
mobility and electron–hole recombination rates, as well as the site reactivity for catalysis.
Sponsor
Grant Number
Science Foundation Ireland (SFI)
PI_15/IA/ 3131
Science Foundation Ireland (SFI)
PI_12/IA/1264
Irish Research Council for Science and Engineering Technology (IRCSET)
IRCLA/2019/171
Irish Research Council (IRC)
GOIPD/2018/653
European Commission
881603
Science Foundation Ireland (SFI)
2/RC/2278_P2
BMBF
16ES1121
Science Foundation Ireland (SFI)
15/SIRG/3329
Author's Homepage:
http://people.tcd.ie/zhussupahttp://people.tcd.ie/duesberg
http://people.tcd.ie/ivchvets
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npj 2D Materials and Applications5
14
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Nanoscience & Materials , NANOSTRUCTURES , Nanotechnology , SEMICONDUCTOR DEVICES AND MATERIALSDOI:
https://doi.org/10.1038/s41699-020-00196-8Licences: