Structural and optoelectronic properties of sputtered copper(I) chloride
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Natarajan, G., O'Reilly, L., Daniels, S., Cameron, D.C., McNally, P.J., Lucas, O., Reader, A., Mitra A. & Bradley, A.L. Structural and optoelectronic properties of sputtered copper(I) chloride, Proceedings of SPIE, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks, SPIE Opto-Ireland 2005, Dublin, 2005, John G. McInerney, Gerard Farrell, David M. Denieffe, Liam P. Barry, Harold S. Gamble, Padraig J. Hughes, Alan Moore , 5825, 2005, 364-369Download Item:
5825_55 SPIE opto IRL 2005 cucl 2.pdf (PDF) 99.55Kb
Abstract:
Copper (I) Chloride is a wide band gap semiconductor with great potential for silicon-based optoelectronics due to the fact that is closely lattice matched with silicon. This work examines the deposition of CuCl thin films by magnetron sputtering on silicon and glass substrates. Film structural and morphological properties are studied with X-ray diffraction and atomic force microscopy. Optical absorbance and luminescence spectra of CuCl thin films are analysed in order to study the excitonic features. The influence of deposition process parameters and post annealing on the film properties are also reported.
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Author: Bradley, Louise; Natarajan, Gomathi; O'Reilly, Lisa; Daniels, Stephen; Cameron, David C.; McNally, Patrick; Lucas, Olabanji; Reader, Alec; Mitra, Anirban
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Proceedings of SPIE, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical NetworksSPIE Opto-Ireland 2005
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5825;Availability:
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CuC1, Magnetron sputtering, XRD, Luminescence, ExcitonDOI:
http://dx.doi.org/10.1117/12.605100Licences: