Atomic force microscope cantilevers for combined thermomechanical data writing and reading
Citation:
Graham Cross, Michel Despont, Urs Dürig, Hugo Rothuizen, Gerd K. Binnig, and Peter Vettiger, William P. King, Thomas W. Kenny, and Kenneth E. Goodson, Atomic force microscope cantilevers for combined thermomechanical data writing and reading, Applied Physics Letters, 78, 9, 2001, 1300-1302Download Item:
Abstract:
Heat conduction governs the ultimate writing and reading capabilities of a thermomechanicaldata storage device. This work investigates transient heat conduction in a resistively heated atomic force microscope cantilever through measurement and simulation of cantilever thermal and electrical behavior. The time required to heat a single cantilever to bit-writing temperature is near 1 μs and the thermal data reading sensitivity ΔR/R is near 1×10−4 per vertical nm. Finite-difference thermal and electrical simulation results compare well with electrical measurements during writing and reading, indicating design tradeoffs in power requirements, data writing speed, and data reading sensitivity. We present a design for a proposed cantilever that is predicted to be faster and more sensitive than the present cantilever.
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http://people.tcd.ie/crossgDescription:
PUBLISHED
Author: CROSS, GRAHAM
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Journal ArticleCollections
Series/Report no:
Applied Physics Letters78
9
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Full text availableKeywords:
Atomic force microscopes, Heat conduction, Thermomechanical treatments, Data acquisition, Electric measurementsDOI:
http://dx.doi.org/10.1063/1.1351846Metadata
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