High resolution STM imaging with oriented single crystalline tips
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2013Access:
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Chaika, AN, Nazin, SS, Semenov, VN, Orlova, NN, Bozhko, SI, Lubben, O, Krasnikov, SA, Radican, K, Shvets, IV, High resolution STM imaging with oriented single crystalline tips, APPLIED SURFACE SCIENCE, 267, 2013, 219-223Download Item:
Applie Surface Science_2013_Chaika_accepted (2).pdf (PDF) 1.662Mb
Abstract:
Precise knowledge of the atomic and electronic structure of scanning tunneling microscopy (STM) tips is crucial for a correct interpretation of atomically resolved STM data and an improvement of the spatial resolution. Here we demonstrate that tungsten probes with controllable electronic structure can be fabricated using oriented single crystalline tips. High quality of the [0 0 1]-oriented W tips sharpened in ultra high vacuum was proved by electron microscopy. Distance dependent STM studies carried out on a graphite (0 0 0 1) surface demonstrate that application of crystallographically oriented single crystalline tips allows one to control the tip electron orbitals responsible for high resolution imaging under specific tunneling conditions. (C) 2012 Elsevier B. V. All rights reserved.
Sponsor
Grant Number
Russian Foundation for Basic Research
11-02-01256
SFI E.T.S. Walton Programme
Marie Curie IIF grant within the 7th European Community Framework Programme
Author's Homepage:
http://people.tcd.ie/chaikaahttp://people.tcd.ie/ivchvets
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APPLIED SURFACE SCIENCEType of material:
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APPLIED SURFACE SCIENCE;267;
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0169-4332Licences: