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dc.contributor.authorCOEY, JOHNen
dc.contributor.authorVENKATESAN, MUNUSWAMYen
dc.contributor.authorTOKUC, HUSEYINen
dc.contributor.authorBURKE, FRANKLYNen
dc.date.accessioned2011-06-24T16:28:04Z
dc.date.available2011-06-24T16:28:04Z
dc.date.issued2011en
dc.date.submitted2011en
dc.identifier.citationVenkatesan, M, Tokuc, H, Burke, F, Szulczewski, G, Coey, JMD, Magnetic properties of the Co/Alq(3) interface, Journal of Applied Physics, 109, 7, 2011, 07C507-en
dc.identifier.otherYen
dc.identifier.urihttp://hdl.handle.net/2262/57248
dc.descriptionPUBLISHEDen
dc.description.abstractA method is described for measuring the magnetic integrity of ferromagnetic/organic interfaces that involves measuring the magnetic moment per unit area of bilayers with different ferromagnet thicknesses. The method is first used to determine the thickness of the oxide passivation layer on Co and Co90Fe10 (3.0 and 1.6 nm, respectively). The Alq3/Co interface is rather sharp, with roughness confined to about 3 monolayers of Co at the interface. The Co/Alq3 interface seems to be much rougher, with a dead layer that is several nanometers thick, However, this layer can be eliminated by capping the Alq3 layer with Al, so the dead layer is attributed to oxidation of the cobalt surface through the organic. The interface sharpness is improved when a 1 nm layer of LiF is inserted between Co and Alq3.en
dc.format.extent07C507en
dc.language.isoenen
dc.relation.ispartofseriesJournal of Applied Physicsen
dc.relation.ispartofseries109en
dc.relation.ispartofseries7en
dc.rightsYen
dc.subjectCondensed matter physicsen
dc.subjectThin filmsen
dc.titleMagnetic properties of the Co/Alq(3) interfaceen
dc.typeJournal Articleen
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jcoeyen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/venkatemen
dc.identifier.rssinternalid73769en
dc.contributor.sponsorGrantNumberIN/1850/05en
dc.subject.TCDThemeNanoscience & Materialsen
dc.identifier.rssurihttp://dx.doi.org/10.1063/1.3562504en


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