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dc.contributor.authorDONEGAN, JOHN FRANCIS
dc.contributor.authorBARKLIE, ROBERT CHARLES
dc.date.accessioned2010-02-11T11:41:27Z
dc.date.available2010-02-11T11:41:27Z
dc.date.issued1996
dc.date.submitted1996en
dc.identifier.citationJ. D. Carey, J. F. Donegan, and R. C. Barklie, F. Priolo, G. Franzo and S. Coffa, Electron paramagnetic resonance of erbium doped silicon, Applied Physics Letters, 69, 1996, p3854 - 3856en
dc.identifier.otherY
dc.identifier.urihttp://hdl.handle.net/2262/37526
dc.descriptionPUBLISHEDen
dc.description.abstractElectron paramagnetic resonance measurements have been made on samples of float zone silicon, implanted with 1015 Er/cm2. One sample was coimplanted with oxygen to give an impurity concentration of 1020 O/cm3 and 1019 Er/cm3. In this coimplanted sample, sharp lines are observed which are identified as arising from a single spin 1/2 Er31 center having a g tensor exhibiting monoclinic C1h symmetry. The principal g values and tilt angle are g150.80, g255.45, g3512.60, and t52.6?. In the absence of O, the sharp lines are not observed. No Er31 cubic centers were detected in either sample. Possible structures for the center are discussed.en
dc.format.extent3854en
dc.format.extent3856en
dc.format.extent90090 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherAmerican Institute of Physcisen
dc.relation.ispartofseriesApplied Physics Lettersen
dc.relation.ispartofseries69en
dc.rightsYen
dc.subjectSILICONen
dc.subjectDOPED MATERIALSen
dc.subjectERBIUM ADDITIONSen
dc.subjectION IMPLANTATIONen
dc.titleElectron paramagnetic resonance of erbium doped siliconen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jdonegan
dc.identifier.peoplefinderurlhttp://people.tcd.ie/rbarklie
dc.identifier.rssinternalid4873
dc.identifier.rssurihttp://dx.doi.org/10.1063/1.117127


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