Combined scanning tunneling microscopy (STM) & surface stress measurements (SSM) of chemical reactions on semiconductor surfaces : oxidation of the Si(111)-(7x7)surface

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Meehan TCD THESIS 9766 Combined scanning.pdf
Size:
43.83 MB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
3.5 KB
Format:
Item-specific license agreed upon to submission
Description: