• Automatic location of IC design errors using an e-beam system

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    Date

    1988

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    IEEE

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    Melgara, M., Battu, M., Garino, P., Dowe, J., Vernay, Y.J., Marzouki, M., Boland, F., Automatic location of IC design errors using an e-beam system, [in] digest of papers - International Test Conference , Washington, DC, : IEEE, 1988, pp898-907

    Abstract

    The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed search

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    PUBLISHED

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    http://hdl.handle.net/2262/19679

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    Electronic & Electrical Eng (Scholarly Publications)
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    Keywords

    E-beam tester, ADVICE system, VLSI devices
    Author's Homepage: http://people.tcd.ie/fboland

    Author: BOLAND, FRANCIS MORGAN

    Other Titles: International Test Conference: 1988
    Publisher: IEEE
    Type of material: Conference Paper