Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity

DONEGAN, JOHN; BRADLEY, LOUISE

Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity

Files

01547910.pdf (258.97 KB)

Date

2005

Authors

DONEGAN, JOHN

BRADLEY, LOUISE

Citation

Maguire, P.J. and Barry, L.P. and Krug, T. and Dowd, J.O. and Lynch, M. and Bradley, A.L. and Donegan, J.F. and Folliot, H., Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity, Proceedings of SPIE, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks, SPIE Opto-Ireland 2005, John G. McInerney, Gerard Farrell, David M. Denieffe, Liam P. Barry, Harold S. Gamble, Padraig J. Hughes, Alan Moore , 2005, 142 - 143

Abstract

The future development of high-speed optical data channels, operating at individual data rates in excess of 100Gbit/s, will require a sensitive and ultra-fast method for pulse measurement [1]. Current high-speed signals are usually characterized using a fast photodetector in conjunction with a high-speed oscilloscope, but are limited to maximum data rate of approximately 40Gbit/s. An alternative is to employ all-optical sampling techniques based on ultra-fast optical nonlinearities present in optical fibres, crystals and semiconductors. One such nonlinearity is the optical-to-electrical process of Two-Photon Absorption (TPA) in a semiconductor [2].