An investigation of novel and next generation semiconductor and piezoelectric materials using Raman spectroscopic characterisation

Abstract

Raman spectroscopy is an increasingly prevalent material characterisation technique and this work explored its application to several novel semiconductor and piezoelectric materials. Raman spectroscopy is non-destructive allowing the materials under study to be further characterised by additional techniques. The preparation of samples is straightforward in comparison to many existing techniques and allows for in situ measurements. Raman scattering is a multidisciplinary technique requiring familiarisation with chemistry, condensed matter physics and material science. Raman spectroscopy was used to examine and characterise several semiconductor materials that have promising applications in future semiconductor devices.