Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications

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O'Reilly, L., Mitra, A., Lucas, O.F., Natarajan, G., McNally, P.J., Daniels, S., Lankinen, A., Lowney, D., Bradley, A.L., Cameron, D.C., Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications, Journal of Materials Science: Materials in Electronics, 2007, 18, 1, S57 - S60

Abstract

The use of co-evaporation of ZnCl2 with CuCl in order to achieve n-type conductivity in CuCl is reported herein. Linear current–voltage (IV) characteristics in the range of ±4 V have been measured using Cu–Au electrical contacts. Room temperature Hall effect measurements show some evidence of a mixed conduction mechanism. On average the samples exhibit n-type conductivity with a bulk electron carrier concentration n ∼1 × 1016 cm−3 and Hall mobility μ ∼ 29 cm2v−1s−1 for a CuCl sample doped with a nominal 3 mole % ZnCl2. By use of an in situ CaF2 capping layer, transmission >90% is achieved. At room temperature a strong Z3 free excitonic emission occurs at ∼385 nm using both photoluminescence and x-ray excited optical luminescence, indicating the high optical quality of the doped material.

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Author's Homepage: http://people.tcd.ie/bradlel
Type of material: Journal Article