Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications
Loading...
Date
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Access
openAccess
Embargo end date
Citation
O'Reilly, L., Mitra, A., Lucas, O.F., Natarajan, G., McNally, P.J., Daniels, S., Lankinen, A., Lowney, D., Bradley, A.L., Cameron, D.C., Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications, Journal of Materials Science: Materials in Electronics, 2007, 18, 1, S57 - S60
Abstract
The use of co-evaporation of ZnCl2 with CuCl in order to achieve n-type conductivity in CuCl is reported herein. Linear current–voltage (IV) characteristics in the range of ±4 V have been measured using Cu–Au electrical contacts. Room temperature Hall effect measurements show some evidence of a mixed conduction mechanism. On average the samples exhibit n-type conductivity with a bulk electron carrier concentration n ∼1 × 1016 cm−3 and Hall mobility μ ∼ 29 cm2v−1s−1 for a CuCl sample doped with a nominal 3 mole % ZnCl2. By use of an in situ CaF2 capping layer, transmission >90% is achieved. At room temperature a strong Z3 free excitonic emission occurs at ∼385 nm using both photoluminescence and x-ray excited optical luminescence, indicating the high optical quality of the doped material.
Description
PUBLISHED
Collections
Endorsement
Review
Supplemented By
Referenced By
Keywords
Author's Homepage: http://people.tcd.ie/bradlel
Type of material: Journal Article

