Electron paramagnetic resonance of erbium doped silicon

Loading...
Thumbnail Image

Date

Journal Title

Journal ISSN

Volume Title

Publisher

American Institute of Physcis

Access

Embargo end date

Citation

J. D. Carey, J. F. Donegan, and R. C. Barklie, F. Priolo, G. Franzo and S. Coffa, Electron paramagnetic resonance of erbium doped silicon, Applied Physics Letters, 69, 1996, p3854 - 3856

Abstract

Electron paramagnetic resonance measurements have been made on samples of float zone silicon, implanted with 1015 Er/cm2. One sample was coimplanted with oxygen to give an impurity concentration of 1020 O/cm3 and 1019 Er/cm3. In this coimplanted sample, sharp lines are observed which are identified as arising from a single spin 1/2 Er31 center having a g tensor exhibiting monoclinic C1h symmetry. The principal g values and tilt angle are g150.80, g255.45, g3512.60, and t52.6?. In the absence of O, the sharp lines are not observed. No Er31 cubic centers were detected in either sample. Possible structures for the center are discussed.

Description

PUBLISHED

Endorsement

Review

Supplemented By

Referenced By

Publisher: American Institute of Physcis
Type of material: Journal Article