• Non-contact high resolution microwave scanning measurement technology

    Thumbnail Image

    Files

    non-contact.pdf (173.57 KB)

    Date

    2003

    Authors

    Journal Title

    Journal ISSN

    Volume Title

    Publisher

    IEEE

    Access

    Embargo end date

    Citation

    Berger, N.; Giraudon, J. C.; Sulzbach, T.; Kantor, R.; Shvets, I. V.; Landstorfer, F. M., Non-contact high resolution microwave scanning measurement technology, Electronics Letters, 39, 14, 2003, 1047 - 1048

    Abstract

    For non-contact inspection of microwave integrated and hybrid circuits a technical concept and realisation of a high resolution scanning technique for the detection of the electric field distribution has been developed. The near-field signal is measured in magnitude and phase allowing the calculation of the signal flow in the device under test.

    Description

    PUBLISHED

    URI

    http://hdl.handle.net/2262/41036

    Collections

    Physics (Scholarly Publications)
    RSS Feeds

    Endorsement

    Review

    Supplemented By

    Referenced By

    Keywords

    Particles and fields physics, near-field signal

    Sponsor: European Union (EU)

    Author's Homepage: http://people.tcd.ie/ivchvets

    Author: SHVETS, IGOR

    Publisher: IEEE
    Type of material: Journal Article