Optical impedance matching with scanning near-field optical microscopy
Citation:
Gademann, A.; Durkan, C.; Shvets, I. V., Optical impedance matching with scanning near-field optical microscopy, Journal of Physics D (Applied Physics), 36, 18, 2003, 2193-7Abstract:
We present an experimental study of the coupling of energy from a waveguide into a submicron size optical transmission line (gold on silicon). We demonstrate that the coupling efficiency depends upon the polarization direction. On the condition when a TEM mode is launched in the transmission line we observe a substantial enhancement of the coupling efficiency. The coupling efficiency also depends on the impedance of the transmission line that is in turn determined by its geometry. We have made a prediction of the condition of the maximum coupling efficiency through the approach of impedance matching. We believe these results can be of importance in the development of new concepts for high resolution optical imaging by means of scanning near-field optical microscopy.
Sponsor
Grant Number
European Union (EU)
G5RD-CT-1999-00005
European Union (EU)
(ERBFMRXCT98-0242
Science Foundation Ireland (SFI)
Author's Homepage:
http://people.tcd.ie/ivchvetsDescription:
PUBLISHED
Author: SHVETS, IGOR
Type of material:
Journal ArticleCollections
Series/Report no:
Journal of Physics D (Applied Physics)36
18
Availability:
Full text availableKeywords:
shear-force, polarisation, resolution, lightMetadata
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