Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction
ARORA, SUNIL KUMAR
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Citation:A. Koblischka-Venevaa, M. R. Koblischka, S. Murphy and S. K. Arora, F. Mucklich, U. Hartmann and I. V. Shvets, Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction, Journal of Applied Physics, 52nd Annual Conference on Magnetism and Magnetic Materials, Tampa, Florida, USA, 05-09 November 2007, Koblischka-Veneva, A.; Koglischka, M. R.; Murphy, S.; Arora, S. K.; Mucklich, F.; Hartmann, U.; Shvets, I. V., 103, 7, AIP, 2008, 07E505
The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100?400?nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1?min, 250??C) is characterized by the presence of tiny (diameter of 100?200?nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm-thick film with (001) orientation, even close to the interface MgO-magnetite.
European Union (EU)
Keywords:Atomic, molecular and chemical physics
Publisher:American Institute of Physics