Fabrication of magnetic force microscopy tips by electrodeposition and focused ion beam milling
Citation:
O. Cespedes, A. Luu, M.F.M. Rhen and J.M.D. Coey 'Fabrication of magnetic force microscopy tips by electrodeposition and focused ion beam milling' in IEEE Transactions on Magnetics, 44, (11), 2008, pp 3248-3251Download Item:
Abstract:
A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam
milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without
altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature
and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements
and nano-imprinting.
Sponsor
Grant Number
Science Foundation Ireland
Author's Homepage:
http://people.tcd.ie/jcoeyDescription:
PUBLISHED
Author: COEY, JOHN MICHAEL DAVID
Publisher:
IEEEType of material:
Journal ArticleCollections
Series/Report no:
IEEE Transactions on Magnetics44
11
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