Browsing Physics (Scholarly Publications) by Subject "Terms Electrodeposition, focused ion beam milling, magnetic force microscopy (MFM), tip fabrication."
Now showing items 1-1 of 1
-
Fabrication of magnetic force microscopy tips by electrodeposition and focused ion beam milling
(IEEE, 2008)A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting ...