Developing state of the art sample preparation for high-resolution electron microscopy

Abstract

In recent years there have been great advances in scanning transmission electron microscopes, in particular, high-resolution low voltage imaging and high-resolution electron energy loss spectroscopy. These techniques rely heavily on high-quality ultra-thin defect-free samples. Through carefully designed practical experiments and computational modelling, this research project investigates a range of ion species (Ga, Ne, He) interacting with silicon. The end goal of this project is to develop a tangible solution to taking a bulk material and making a sample suitable for high-resolution imaging and spectroscopy