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dc.contributor.advisorShvets, Igor
dc.contributor.authorKantor, Roman
dc.date.accessioned2019-07-25T13:30:42Z
dc.date.available2019-07-25T13:30:42Z
dc.date.issued2002
dc.identifier.citationRoman Kantor, 'Scanning near-field microscopy of microwave circuits', [thesis], Trinity College (Dublin, Ireland). School of Physics, 2002, pp 156
dc.identifier.otherTHESIS 6918
dc.identifier.urihttp://hdl.handle.net/2262/88901
dc.description.abstractThe topic of this thesis is the development and testing of measurement techniques for high resolution imaging of the field induced by microwave circuits in the near-field region. The theoretical aspects of the near-field acquisition are given and all alternative approaches to the practical realization of the measurement set-up are studied.
dc.format1 volume
dc.language.isoen
dc.publisherTrinity College (Dublin, Ireland). School of Physics
dc.relation.isversionofhttp://stella.catalogue.tcd.ie/iii/encore/record/C__Rb12429409
dc.subjectPhysics, Ph.D.
dc.subjectPh.D. Trinity College Dublin
dc.titleScanning near-field microscopy of microwave circuits
dc.typethesis
dc.type.supercollectionthesis_dissertations
dc.type.supercollectionrefereed_publications
dc.type.qualificationlevelDoctoral
dc.type.qualificationnameDoctor of Philosophy (Ph.D.)
dc.rights.ecaccessrightsopenAccess
dc.format.extentpaginationpp 156
dc.description.noteTARA (Trinity's Access to Research Archive) has a robust takedown policy. Please contact us if you have any concerns: rssadmin@tcd.ie


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