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dc.contributor.authorSHVETS, IGOR
dc.contributor.authorLUEBBEN, OLAF
dc.contributor.authorCHAIKA, ALEXANDER
dc.date.accessioned2013-10-21T13:52:02Z
dc.date.available2013-10-21T13:52:02Z
dc.date.issued2013
dc.date.submitted2013en
dc.identifier.citationChaika, AN, Nazin, SS, Semenov, VN, Orlova, NN, Bozhko, SI, Lubben, O, Krasnikov, SA, Radican, K, Shvets, IV, High resolution STM imaging with oriented single crystalline tips, APPLIED SURFACE SCIENCE, 267, 2013, 219-223en
dc.identifier.issn0169-4332
dc.identifier.otherY
dc.identifier.urihttp://hdl.handle.net/2262/67517
dc.descriptionPUBLISHEDen
dc.description.abstractPrecise knowledge of the atomic and electronic structure of scanning tunneling microscopy (STM) tips is crucial for a correct interpretation of atomically resolved STM data and an improvement of the spatial resolution. Here we demonstrate that tungsten probes with controllable electronic structure can be fabricated using oriented single crystalline tips. High quality of the [0 0 1]-oriented W tips sharpened in ultra high vacuum was proved by electron microscopy. Distance dependent STM studies carried out on a graphite (0 0 0 1) surface demonstrate that application of crystallographically oriented single crystalline tips allows one to control the tip electron orbitals responsible for high resolution imaging under specific tunneling conditions. (C) 2012 Elsevier B. V. All rights reserved.en
dc.format.extent219-223en
dc.language.isoenen
dc.publisherAPPLIED SURFACE SCIENCEen
dc.relation.ispartofseriesAPPLIED SURFACE SCIENCE;
dc.relation.ispartofseries267;
dc.rightsYen
dc.subject.otherSTM imaging
dc.titleHigh resolution STM imaging with oriented single crystalline tipsen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/chaikaa
dc.identifier.peoplefinderurlhttp://people.tcd.ie/ivchvets
dc.identifier.rssinternalid88935
dc.rights.ecaccessrightsOpenAccess
dc.contributor.sponsorRussian Foundation for Basic Researchen
dc.contributor.sponsorGrantNumber11-02-01256en
dc.contributor.sponsorSFI E.T.S. Walton Programmeen
dc.contributor.sponsorMarie Curie IIF grant within the 7th European Community Framework Programmeen


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