Rapid Thermal Oxidation of Strained-Ge Layers
Citation:
S. Das, S. Chakraborty, S. Bhattacharya, M. Bain, J. McCarthy, B.M. Armstrong, H.S. Gamble, G.K. Dalapati, S.K. Samanta, T. Perova, R.A. Moore and C.K. Maiti, Rapid Thermal Oxidation of Strained-Ge Layers, IEEE 24th International Conference on Microelectronics (MIEL-2004), NIS, Serbia and Montenegro, 16-19 May, 24, 2, 2004, 479, 482Download Item:
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http://people.tcd.ie/rmoorehttp://people.tcd.ie/perovat
Description:
PRESENTEDNIS, Serbia and Montenegro
Oral Presentation.
Author: MOORE, ALAN; PEROVA, TANIA
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IEEE 24th International Conference on Microelectronics (MIEL-2004)Type of material:
Conference PaperSeries/Report no:
242
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Electronic & Electrical EngineeringMetadata
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