Joint Channel Estimation and Equalization in Massive MIMO Using a Single Pilot Subcarrier

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Journal ArticleDate:
2023Access:
openAccessCitation:
D. L. Li and A. Farhang, "Joint Channel Estimation and Equalization in Massive MIMO Using a Single Pilot Subcarrier," in IEEE Wireless Communications Letters, vol. 12, no. 11, pp. 1931-1935, Nov. 2023Download Item:
Abstract:
The focus of this letter is on the reduction of the
large pilot overhead in orthogonal frequency division multi-plexing (OFDM) based massive multiple-input multiple-output
(MIMO) systems. We propose a novel joint channel estimation
and equalization technique that requires only one pilot sub-
carrier, reducing the pilot overhead by orders of magnitude.
We take advantage of the coherence bandwidth spanning over
multiple subcarrier bands. This allows for a band of subcarriers
to be equalized with the channel frequency response (CFR) at
a single subcarrier. Subsequently, the detected data symbols
are considered as virtual pilots, and their CFRs are updated
without additional pilot overhead. Thereafter, the remaining
channel estimation and equalization can be performed in a
sliding manner. With this approach, we use multiple channel
estimates to equalize the data at each subcarrier. This allows us to
take advantage of frequency diversity and improve the detection
performance. Finally, we corroborate the above claims through
extensive numerical analysis, showing the superior performance
of our proposed technique compared to conventional methods.
Sponsor
Grant Number
Science Foundation Ireland (SFI)
21/US/3757
Science Foundation Ireland (SFI)
19/FFP/7005(T)
Author's Homepage:
http://people.tcd.ie/afarhangDescription:
PUBLISHED
Author: Lelin Li, Danilo; Farhang, Arman
Type of material:
Journal ArticleSeries/Report no:
IEEE Wireless Communications Letters;12;
11;
Availability:
Full text availableKeywords:
OFDM, massive MIMO, channel estimation, linear combining, spatial diversity, spectral efficiencySubject (TCD):
Telecommunications , DIGITAL SIGNAL PROCESSING , ELECTRONICSDOI:
http://dx.doi.org/10.48550/arXiv.2212.07781https://doi.org/10.1109/LWC.2023.3299414
ISSN:
2162-2337Metadata
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