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dc.contributor.authorZHANG, HONGZHOU
dc.date.accessioned2014-04-02T15:54:15Z
dc.date.available2014-04-02T15:54:15Z
dc.date.issued2010
dc.date.submitted2010en
dc.identifier.citationLiao, ZM, Zhang, HZ, Yu, DP, Ultralow-frequency photocurrent oscillation in ZnO nanowires, Applied Physics Letters, 97, 3, 2010, 033113-en
dc.identifier.otherY
dc.identifier.urihttp://hdl.handle.net/2262/68381
dc.descriptionPUBLISHEDen
dc.description.abstractWe report experimental results of ultralow frequency photocurrent oscillation in individual ZnO nanowires. Consecutive photocurrent and photoluminescence measurements corroborate the process of capture and release of photogenerated holes by surface trap states. The dynamic process results in the oscillation of the thickness of surface depletion region, which is believed to be responsible for the observed photocurrent oscillation.en
dc.format.extent033113en
dc.language.isoenen
dc.relation.ispartofseriesApplied Physics Letters;
dc.relation.ispartofseries97;
dc.relation.ispartofseries3;
dc.rightsYen
dc.subjectPhysicsen
dc.titleUltralow-frequency photocurrent oscillation in ZnO nanowiresen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/hozhang
dc.identifier.rssinternalid69942
dc.rights.ecaccessrightsOpenAccess


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