Browsing School of Engineering by Author "WASYLUK, JOANNA"
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Composition and strain in thin Si1-xGex virtual substrates measured by micro-Raman spectroscopy and X-ray diffraction
RODE, KARSTEN; WASYLUK, JOANNA; PEROVA, TANIA (2011)Micro-Raman spectroscopy was employed for the determination of the germanium content, x and strain, , in ultrathin SiGe virtual substrates grown directly on Si by molecular beam epitaxy. The growth of highly relaxed ... -
Raman and Fourier transform infrared study of substitutional carbon incorporation in rapid thermal chemical vapor deposited Si 1-x-yGexCy on (1 0 0) Si
PEROVA, TANIA; WASYLUK, JOANNA (2010)We report on a detailed study of the dependence of the vibrational modes in rapid thermal chemical vapor deposited Si1?x?yGexCy films on the substitutional carbon concentration. Si1?x?yGexCy films were investigated using ...