Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography
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Citation:N. Payraudeau, D. McGrouther and K.U. O'Kelly, Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography, Microscopy and Microanalysis, 17, 2011, 240-245
In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.
Science Foundation Ireland
focused ion beam (FIB) microscopy
Series/Report no:Microscopy and Microanalysis