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dc.contributor.authorSHVETS, IGOR
dc.date.accessioned2011-06-14T16:00:16Z
dc.date.available2011-06-14T16:00:16Z
dc.date.issued1998
dc.date.submitted1998en
dc.identifier.citationOsing, J., Shvets, I.V., Bulk defects in graphite observed with a scanning tunnelling microscope , Surface Science, 417, 1, 1998, 145-150en
dc.identifier.otherY
dc.identifier.urihttp://hdl.handle.net/2262/56875
dc.descriptionPUBLISHEDen
dc.description.abstractScanning tunnelling microscopy (STM) has been used to observe a misorientation of a graphite layer that is buried several layers below the surface. A nanoscale periodic pattern superimposed on the atomic graphite lattice has been observed. The appearance of the superperiodic features in the STM image is shown to be clearly tip-sample distance dependent. We suggest that a subsurface misorientation, several layers deep, causes a nanoscale moire pattern, which can propagate to the surface and contributes to the STM image. This result is rather surprising as STM is thought to be unable to image bulk defects.en
dc.description.sponsorshipIrish Science and Technology Agency Forbairt (grant SC/97/729)en
dc.format.extent145-150en
dc.language.isoenen
dc.publisherElsevieren
dc.relation.ispartofseriesSurface Science;
dc.relation.ispartofseries417;
dc.relation.ispartofseries1;
dc.rightsYen
dc.subjecthighly oriented pyrolytic graphiteen
dc.subjectHOPGen
dc.subjectlayered materialsen
dc.subjectmoire patternen
dc.subjectscanning tunnelling microscopyen
dc.titleBulk defects in graphite observed with a scanning tunnelling microscopeen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/ivchvets
dc.identifier.rssinternalid67453
dc.identifier.rssurihttp://dx.doi.org/10.1016/S0039-6028(98)00678-5en


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