Analysis of slot characteristics in single mode semiconductor lasers using the 2D scattering matrix method
DONEGAN, JOHN FRANCIS
Metadata:Show full item record
Citation:Q. Y. Lu, W. H. Guo, R. Phelan, D. Byrne, J. F. Donegan, and B. Corbett. 'Analysis of slot characteristics in single mode semiconductor lasers using the 2D scattering matrix method.' in Photonics Technology Letters, 18, (24), 2006, pp. 2605 ? 2607.
We use the two-dimensional (2-D) scattering matrix method (SMM) to analyze the slot characteristics in slotted single-mode semiconductor lasers and compare the results with those calculated by the one-dimensional transfer matrix method (TMM). The analysis shows that the 2-D SMM is required to accurately account for the measured results. Using the 2-D SMM simulation, we find that there is almost no reflection at the interface from slot to waveguide while a large reflection exists at the interface from waveguide to slot, and the power loss is much larger than the power reflected. For a single slot, the slot width has little influence on the slot reflectivity, which coincides with the measured results. The reflection and transmission of the slot are found to be exponentially dependent on the slot depth
Science Foundation Ireland
Perfectly matched absorption layers