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SHVETS, IGOR (1)
Subject
Atomic, molecular and chemical physics (1)
R-SNOM imaging (1)
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Date Issued
1998 (1)
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European Union (EU) (1)
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Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light
SHVETS, IGOR
(
American Institute of Physics
,
1998
)