Browsing by Subject "E-beam tester"

Sort by: Order: Results:

Now showing items 1-1 of 1

  • Automatic location of IC design errors using an e-beam system 

    BOLAND, FRANCIS MORGAN (IEEE, 1988)
    The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive ...