Browsing by Sponsor "EPSRC"
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A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride
(2018)Helium ion microscopy (HIM) offers potential as a high spatial resolution technique for imaging insulating samples that are susceptible to charging artifacts. In this study helium and neon ion microscopy are used to image ... -
Electronic Polarizability as the Fundamental Variable in the Dielectric Properties of Two-Dimensional Materials
(2020)The dielectric constant, which defines the polarization of the media, is a key quantity in condensed matter. It determines several electronic and optoelectronic properties important for a plethora of modern technologies ... -
Exfoliablity, magnetism, energy storage and stability of metal thiophosphate nanosheets made in liquid medium
(2023)The family of antiferromagnetic layered metal hexathiohypo diphosphates, M2P2S6 represents a versatile class of materials, particularly interesting for fundamental studies on magnetic properties in low dimensional structures, ... -
Two-Photon Absorption in Monolayer MXenes
(2020)Two‐photon absorption (2PA) is a nonlinear optical (NLO) effect that typically occurs in a conventional semiconductor whose bandgap is larger than the energy of one excited photon but smaller than the energy of two photons. ...