Materials Science focused ion beam (FIB) microscopy
N. Payraudeau, D. McGrouther and K.U. O'Kelly, Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography, Microscopy and Microanalysis, 17, 2011, 240-245
Microscopy and Microanalysis 17
In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.
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